Workshop on Cataloging and Organizing Ephemera
Beinecke Rare Book and Manuscript Library
The presence of ephemeral materials in our collections is a credit to those selectors and curators with the insight to realize the cultural value of such artifacts. But collections of ephemera present unique challenges to catalogers, and in the absence of usable guidelines for their description, they often languish, uncataloged.
Ephemera collections vary in condition, content, format, historical importance, and size. They may include rare and unique artifacts or more commonly produced items exhaustively collected on a particular subject or in a specific format. Whether the individual items should be described in detail or whether one record will represent an entire collection is an important decision. A finding aid may be required to put everything in context, including acquisition and processing information, provenance, scope, etc. But what are the factors to consider in reaching such treatment decisions?
This full day workshop, which is a slightly revised version of the workshop given at the 48th Annual RBMS Preconference in Baltimore in June, 2007, will provide participants with an understanding of the pre-cataloging decisions to be made and the relevant factors to consider when cataloging ephemera. Through presentations, discussion, and hands-on exercises using a variety of ephemera, the workshop will present various options for controlling these important materials (item level vs. collection level treatment; AACR2 vs. DCRM(B); finding aids; digital collections). Participants will receive a packet of resources for creating MARC catalog records in accordance with existing standards and rules.
Participants should be familiar with AACR2 and have some experience cataloging special collections materials. Attendance will be limited to 24 participants (with maximum of 2 per institution). There is no registration fee. Advance registration is required by February 22, 2008.
Instructors: Ann Copeland, Penn State University; Ellen Doon, Yale University; Todd Fell, Yale University; Stephen Skuce, Massachusetts Institute of Technology.
For further information, please contact Todd Fell (phone 203-432-5178).